VLSI Test Principles and Architectures: Design for Testability
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Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, in-stock.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days, Real shipping costs can differ.
Von Händler/Antiquariat, Chocobooks.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website. Paperback, Edition: 1, Label: Morgan Kaufmann, Morgan Kaufmann, Product group: Book, Published: 2006-07-21, Release date: 2002-07-06, Studio: Morgan Kaufmann, Sales rank: 10858894.

Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 24 hours, free shipping for AmazonPrime only. Regular USD 4.98.
Von Händler/Antiquariat, Amazon.com.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website. Paperback, Edition: 1, Label: Morgan Kaufmann, Morgan Kaufmann, Product group: Book, Published: 2006-07-21, Release date: 2002-07-06, Studio: Morgan Kaufmann, Sales rank: 10858894.

Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum download.
Technology, This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days.
Von Händler/Antiquariat, BetterWorldBooksUK.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website. Hardcover, Ausgabe: 1, Label: Morgan Kaufmann, Morgan Kaufmann, Produktgruppe: Book, Publiziert: 2006-07-21, Studio: Morgan Kaufmann, Verkaufsrang: 627286.

Lieferung aus: Indien, Usually dispatched within 1-2 business days, इसके अलावा अगर (शिप) शिपिंग.
Von Händler/Antiquariat, All India Book House.
Modern electronic testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90 nanometers or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and can reach 40% of today's overall product cost. In order to tackle the problems associated with testing semiconductor devices, it is essential to attack them at the earliest possible design stages. This has led to the methodologies and technologies of design for testability (DFT). This book is a comprehensive guide to new DFT techniques that will show the readers how to design a testability and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability, logic built-in self-test (BIST), test compression, logic diagnosis, memory BIST, memory built-in self-repair (BISR), IEEE standard (1149.1, 1149.6 and 1500), and analog and mixed-signal testing. First comprehensive treatment in at-speed testing for logic BIST applications. Recent advances in test compression reducing scan test cost by at least 10X. The only book with coverage of memory fault simulation, DRAM BIST and memory BISR. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Companion website (http://www.books.elsevier.com/companions) allowing the reader to download the DFT and testing software developed by Syn Test Technologies (Sunnyvale, CA), free of charge. Exercise solutions and lecture slides, Paperback, संस्करण: First, लेबल: Elsevier, Elsevier, उत्पाद समूह: Book, प्रकाशित: 2011, स्टूडियो: Elsevier, बिक्री रैंक: 70612.

Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days.
Von Händler/Antiquariat, Inetrade Books.
Modern electronic testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90 nanometers or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and can reach 40% of today's overall product cost. In order to tackle the problems associated with testing semiconductor devices, it is essential to attack them at the earliest possible design stages. This has led to the methodologies and technologies of design for testability (DFT). This book is a comprehensive guide to new DFT techniques that will show the readers how to design a testability and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability, logic built-in self-test (BIST), test compression, logic diagnosis, memory BIST, memory built-in self-repair (BISR), IEEE standard (1149.1, 1149.6 and 1500), and analog and mixed-signal testing. First comprehensive treatment in at-speed testing for logic BIST applications. Recent advances in test compression reducing scan test cost by at least 10X. The only book with coverage of memory fault simulation, DRAM BIST and memory BISR. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Companion website (http://www.books.elsevier.com/companions) allowing the reader to download the DFT and testing software developed by Syn Test Technologies (Sunnyvale, CA), free of charge. Exercise solutions and lecture slides, Paperback, लेबल: Elsevier India, Elsevier India, उत्पाद समूह: Book, प्रकाशित: 2011, स्टूडियो: Elsevier India.

Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days.
Von Händler/Antiquariat, BestBuyDeal.
Modern electronic testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90 nanometers or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and can reach 40% of today's overall product cost. In order to tackle the problems associated with testing semiconductor devices, it is essential to attack them at the earliest possible design stages. This has led to the methodologies and technologies of design for testability (DFT). This book is a comprehensive guide to new DFT techniques that will show the readers how to design a testability and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability, logic built-in self-test (BIST), test compression, logic diagnosis, memory BIST, memory built-in self-repair (BISR), IEEE standard (1149.1, 1149.6 and 1500), and analog and mixed-signal testing. First comprehensive treatment in at-speed testing for logic BIST applications. Recent advances in test compression reducing scan test cost by at least 10X. The only book with coverage of memory fault simulation, DRAM BIST and memory BISR. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Companion website (http://www.books.elsevier.com/companions) allowing the reader to download the DFT and testing software developed by Syn Test Technologies (Sunnyvale, CA), free of charge. Exercise solutions and lecture slides, Paperback, लेबल: Elsevier India, Elsevier India, उत्पाद समूह: Book, प्रकाशित: 2011, स्टूडियो: Elsevier India.

Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
Engineering, This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Lieferung aus: Vereinigte Staaten von Amerika, Free shipping.
Von Händler/Antiquariat, TEXTBOOKSZONE [56595990], NEW DELHI, India.
This is Brand New International Edition, Paperback, Different ISBN with same content, Excellent Quality & Shrink Wrap. English language. Perfect condition. Please contact us for any questions regarding this book.!!