X-ray and Image Analysis in Electron Microscopy als von Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde
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Bester Preis: € 59,90 (vom 03.02.2018)1
X-ray and Image Analysis in Electron Microscopy
DE HC NWISBN: 9783864606748 bzw. 3864606748, in Deutsch, Pro Business, gebundenes Buch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
X-ray and Image Analysis in Electron Microscopy: This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of contents: I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital imaging: Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examples, Englisch, Buch.
X-ray and Image Analysis in Electron Microscopy: This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of contents: I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital imaging: Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examples, Englisch, Buch.
2
X-ray and Image Analysis in Electron Microscopy
DE NWISBN: 9783864606748 bzw. 3864606748, in Deutsch, neu.
Lieferung aus: Deutschland, Lieferzeit: 11 Tage.
This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of contents: I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital imaging: Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examples.
This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of contents: I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital imaging: Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examples.
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X-ray and Image Analysis in Electron Microscopy als von John J. Friel, Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde
DE NWISBN: 9783864606748 bzw. 3864606748, in Deutsch, Pro Business, neu.
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Versandkostenfrei.
X-ray and Image Analysis in Electron Microscopy ab 59.9 EURO 3., Auflage.
X-ray and Image Analysis in Electron Microscopy ab 59.9 EURO 3., Auflage.
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