Estimation of Lattice Strain by X-Ray Analysis - UDM, USDM and UDEDM
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Estimation of Lattice Strain by X-Ray Analysis (2018)
DE PB NWISBN: 9783659950674 bzw. 365995067X, in Deutsch, LAP Lambert Academic Publishing Okt 2018, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, BuchWeltWeit Inh. Ludwig Meier e.K. [57449362], Bergisch Gladbach, Germany.
Neuware - Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported. 84 pp. Englisch.
Von Händler/Antiquariat, BuchWeltWeit Inh. Ludwig Meier e.K. [57449362], Bergisch Gladbach, Germany.
Neuware - Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported. 84 pp. Englisch.
2
Symbolbild
Estimation of Lattice Strain by X-Ray Analysis - UDM, USDM and UDEDM
DE PB NWISBN: 9783659950674 bzw. 365995067X, in Deutsch, LAP Lambert Academic Publishing, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
Estimation of Lattice Strain by X-Ray Analysis: Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported. Englisch, Taschenbuch.
Estimation of Lattice Strain by X-Ray Analysis: Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported. Englisch, Taschenbuch.
3
Estimation of Lattice Strain by X-Ray Analysis - UDM, USDM and UDEDM (2018)
DE PB NWISBN: 9783659950674 bzw. 365995067X, in Deutsch, 84 Seiten, LAP Lambert Academic Publishing, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Syndikat Buchdienst, [4235284].
Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported. 2018, Taschenbuch / Paperback, Neuware, H: 220mm, B: 150mm, 84, Internationaler Versand, Selbstabholung und Barzahlung, PayPal, offene Rechnung, Banküberweisung.
Von Händler/Antiquariat, Syndikat Buchdienst, [4235284].
Wider Bandgap in II-VI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photo-catalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. X-Ray Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported. 2018, Taschenbuch / Paperback, Neuware, H: 220mm, B: 150mm, 84, Internationaler Versand, Selbstabholung und Barzahlung, PayPal, offene Rechnung, Banküberweisung.
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Estimation of Lattice Strain by X-Ray Analysis
DE HC NWISBN: 9783659950674 bzw. 365995067X, in Deutsch, Lap Lambert Academic Publishing, gebundenes Buch, neu.
Lieferung aus: Deutschland, Versandkostenfrei innerhalb von Deutschland.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
5
Symbolbild
Estimation of Lattice Strain by X-Ray Analysis
DE PB NWISBN: 9783659950674 bzw. 365995067X, in Deutsch, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, European-Media-Service Mannheim [1048135], Mannheim, Germany.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Von Händler/Antiquariat, European-Media-Service Mannheim [1048135], Mannheim, Germany.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
6
Estimation of Lattice Strain by X−Ray Analysis: UDM, USDM and UDEDM (2018)
EN PB NWISBN: 9783659950674 bzw. 365995067X, in Englisch, 84 Seiten, LAP LAMBERT Academic Publishing, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Versandkostenfrei. Tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, expressbuch24.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Von Händler/Antiquariat, expressbuch24.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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