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100%: Herausgeber: Gernot Friedbacher, Herausgeber: Henning Bubert: Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (English Edition) (ISBN: 9783527636952) 2011, Wiley-VCH, in Englisch, auch als eBook.Nur diese Ausgabe anzeigen…
100%: Bubert, H: Surface and Thin Film Analysis : Compendium of Principles, Instrumentation and Applications: A Compendium of Principles, Instrumentation, and Applications (Chemistry) (ISBN: 9783527304585) Erstausgabe, in Deutsch, Broschiert.Nur diese Ausgabe anzeigen…
100%: Gernot Friedbacher: Surface and Thin Film Analysis (ISBN: 9783527636938) in Englisch, Band: 125, Taschenbuch.Nur diese Ausgabe anzeigen…
71%: Friedbacher, Gernot; Bubert, Henning: Surface and Thin Film Analysis : A Compendium of Principles, Instrumentation, and Applications (ISBN: 9783527636945) Erstausgabe, in Englisch, Taschenbuch.Nur diese Ausgabe anzeigen…
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (English Edition)
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1
Surface Thin Film Analysis: A Compendium of Principles, Instrumentation, Applications (Chemistry) Auflage: 1. Auflage (1922)
~DE USISBN: 9783527304585 bzw. 3527304584, vermutlich in Deutsch, Wiley-VCH Verlag GmbH & Co. KGaA, gebraucht, guter Zustand.
Lieferung aus: Deutschland, Versandkosten in die BRD.
Von Händler/Antiquariat, Modernes Antiquariat an der Kyll, 54587 Lissendorf.
Auflage: 1. Auflage 353 Seiten 24,4 x 17,0 x 2,4 cm, Gebundene Ausgabe Coverecken leicht gestaucht, leichte Knicke im Cover, kleine Lagerspuren am Buch, Inhalt einwandfrei und ungelesen 412067 Versand D: 3,00 EUR, Angelegt am: 08.03.2018.
Von Händler/Antiquariat, Modernes Antiquariat an der Kyll, 54587 Lissendorf.
Auflage: 1. Auflage 353 Seiten 24,4 x 17,0 x 2,4 cm, Gebundene Ausgabe Coverecken leicht gestaucht, leichte Knicke im Cover, kleine Lagerspuren am Buch, Inhalt einwandfrei und ungelesen 412067 Versand D: 3,00 EUR, Angelegt am: 08.03.2018.
2
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (English Edition) (2011)
EN NW EB DLISBN: 9783527636952 bzw. 3527636951, in Englisch, 558 Seiten, 2. Ausgabe, Wiley-VCH, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, E-Book zum Download, Versandkostenfrei.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Ausgabe, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 2261112.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Ausgabe, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 2261112.
3
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2011)
EN NW FE EB DLISBN: 9783527636952 bzw. 3527636951, in Englisch, 558 Seiten, Wiley-VCH, neu, Erstausgabe, E-Book, elektronischer Download.
Lieferung aus: Deutschland, E-Book zum Download.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 1299028.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 1299028.
4
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2011)
EN NW EB DLISBN: 9783527636952 bzw. 3527636951, in Englisch, 558 Seiten, 2. Ausgabe, Wiley-VCH, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, E-Book zum Download.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 456993.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 456993.
5
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2011)
EN NW EB DLISBN: 9783527636952 bzw. 3527636951, in Englisch, 558 Seiten, 2. Ausgabe, Wiley-VCH, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, E-Book zum Download.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 511649.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 511649.
6
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2011)
EN NW FE EB DLISBN: 9783527636952 bzw. 3527636951, in Englisch, 558 Seiten, Wiley-VCH, neu, Erstausgabe, E-Book, elektronischer Download.
Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum Download.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 3195060.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 1, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH, Verkaufsrang: 3195060.
7
Surface and Thin Film Analysis (2011)
EN NW EB DLISBN: 9783527636952 bzw. 3527636951, in Englisch, 558 Seiten, 2. Ausgabe, Wiley-VCH, neu, E-Book, elektronischer Download.
Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum Download.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society), Kindle Edition, Ausgabe: 2, Format: Kindle eBook, Label: Wiley-VCH, Wiley-VCH, Produktgruppe: eBooks, Publiziert: 2011-09-07, Freigegeben: 2011-09-07, Studio: Wiley-VCH.
8
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (Chemistry) (2002)
DE HC US FEISBN: 9783527304585 bzw. 3527304584, in Deutsch, 353 Seiten, Bubert, Henning, Jenett, Holger, Wiley-VCH Verlag GmbH & Co. KGaA, gebundenes Buch, gebraucht, akzeptabler Zustand, Erstausgabe.
Neu ab: 162,00 € (2 Angebote)
Gebraucht ab: 23,58 € (7 Angebote)
Zu den weiteren 9 Angeboten bei Amazon.de
Lieferung aus: Vereinigtes Königreich Großbritannien und Nordirland, Auf Lager. Tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, Phatpocket Bücher.
Wiley-VCH Verlag GmbH & Co. KGaA, Gebundene Ausgabe, Ausgabe: 1. Auflage, Publiziert: 2002-02-22T00:00:01Z, Produktgruppe: Buch, Verkaufsrang: 10090.
Von Händler/Antiquariat, Phatpocket Bücher.
Wiley-VCH Verlag GmbH & Co. KGaA, Gebundene Ausgabe, Ausgabe: 1. Auflage, Publiziert: 2002-02-22T00:00:01Z, Produktgruppe: Buch, Verkaufsrang: 10090.
9
Surface Thin Film Apllications. Principles, Instrumentation, Applications. (2003)
~DE HC USISBN: 9783527304585 bzw. 3527304584, vermutlich in Deutsch, Weinheim, Wiley-VCH, gebundenes Buch, gebraucht, guter Zustand.
Lieferung aus: Deutschland, Versandkosten in die BRD.
Von Händler/Antiquariat, Antiquariat Thomas Haker GmbH & Co. KG, 10439 Berlin.
336 S. Hardcover/Pappeinband Guter Zustand. Bibl.-Ex. Versand D: 3,50 EUR Spektroskopie, Angelegt am: 28.09.2018.
Von Händler/Antiquariat, Antiquariat Thomas Haker GmbH & Co. KG, 10439 Berlin.
336 S. Hardcover/Pappeinband Guter Zustand. Bibl.-Ex. Versand D: 3,50 EUR Spektroskopie, Angelegt am: 28.09.2018.
10
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation and Applications (2002)
DE NWISBN: 9783527304585 bzw. 3527304584, in Deutsch, 353 Seiten, Wiley VCH, neu.
Neu ab: 135,55 € (3 Angebote)
Gebraucht ab: 23,70 € (3 Angebote)
Zu den weiteren 6 Angeboten bei Amazon.fr
Lieferung aus: Frankreich, Tatsächliche Versandkosten können abweichen.
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