Testing Embedded System - 5 Angebote vergleichen

Bester Preis: 80,52 (vom 03.09.2019)
1
9783330331174 - Neelesh Jain: Testing Embedded System
Symbolbild
Neelesh Jain

Testing Embedded System (2019)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783330331174 bzw. 3330331178, vermutlich in Englisch, LAP Lambert Academic Publishing Aug 2019, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
Neuware - The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more. 260 pp. Englisch.
2
9783330331174 - Neelesh Jain: Testing Embedded System
Neelesh Jain

Testing Embedded System

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783330331174 bzw. 3330331178, vermutlich in Englisch, LAP Lambert Academic Publishing, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Testing Embedded System: The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more. Englisch, Taschenbuch.
3
9783330331174 - Jain, Neelesh: Testing Embedded System
Jain, Neelesh

Testing Embedded System (2019)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783330331174 bzw. 3330331178, vermutlich in Englisch, 260 Seiten, LAP Lambert Academic Publishing, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Syndikat Buchdienst, [4235284].
The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more. 2019, Taschenbuch / Paperback, Neuware, H: 220mm, B: 150mm, 260, Internationaler Versand, Selbstabholung und Barzahlung, PayPal, offene Rechnung, Banküberweisung.
4
3330331178 - Testing Embedded System

Testing Embedded System

Lieferung erfolgt aus/von: Deutschland ~EN NW

ISBN: 3330331178 bzw. 9783330331174, vermutlich in Englisch, neu.

Testing Embedded System ab 82.9 EURO.
5
9783330331174 - Dr. Neelesh Jain: Testing Embedded System
Dr. Neelesh Jain

Testing Embedded System (2019)

Lieferung erfolgt aus/von: Deutschland EN PB NW

ISBN: 9783330331174 bzw. 3330331178, in Englisch, 260 Seiten, LAP LAMBERT Academic Publishing, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Versandkostenfrei. Tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, M & L aus Deutschland.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Lade…