Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.
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9783839609163 - Christian Geisler: Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.
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Christian Geisler

Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts. (2015)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783839609163 bzw. 383960916X, in Deutsch, Fraunhofer Verlag Sep 2015, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Agrios-Buch [57449362], Bergisch Gladbach, Germany.
Neuware - The combination of localized laser patterning and metal plating allows to replace conventional silver screen printing with nickel-copper plating to form inexpensive front contacts for crystalline silicon solar cells. In this work, a focus is put on effects that could cause inhomogeneous metal deposition and low metal contact adhesion. A descriptive model of the silicon nitride ablation mechanism is derived from SEM imaging and a precise recombination analysis using QSSPC measurements. Surface sensitive XPS measurements are conducted to prove the existence of a parasitic surface layer, identified as SiOxNy. The dense SiOxNy layer is an effective diffusion barrier, hindering the formation of a nickel silicide interlayer. After removal of the SiOxNy layer, cells show severe degradation caused by metal-induced shunting. These shunts are imaged using reverse biased electroluminescence imaging. A shunting mechanism is proposed and experimentally verified. New laser process sequences are devised and proven to produce cells with adhering Ni-Cu contacts. Conclusively the developed processes are assessed based on their industrial feasibility as well as on their efficiency potential. 195 pp. Englisch.
2
9783839609163 - Christian Geisler: Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.
Symbolbild
Christian Geisler

Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts. (2015)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783839609163 bzw. 383960916X, in Deutsch, Fraunhofer Verlag Sep 2015, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, sparbuchladen [52968077], Göttingen, Germany.
Neuware - The combination of localized laser patterning and metal plating allows to replace conventional silver screen printing with nickel-copper plating to form inexpensive front contacts for crystalline silicon solar cells. In this work, a focus is put on effects that could cause inhomogeneous metal deposition and low metal contact adhesion. A descriptive model of the silicon nitride ablation mechanism is derived from SEM imaging and a precise recombination analysis using QSSPC measurements. Surface sensitive XPS measurements are conducted to prove the existence of a parasitic surface layer, identified as SiOxNy. The dense SiOxNy layer is an effective diffusion barrier, hindering the formation of a nickel silicide interlayer. After removal of the SiOxNy layer, cells show severe degradation caused by metal-induced shunting. These shunts are imaged using reverse biased electroluminescence imaging. A shunting mechanism is proposed and experimentally verified. New laser process sequences are devised and proven to produce cells with adhering Ni-Cu contacts. Conclusively the developed processes are assessed based on their industrial feasibility as well as on their efficiency potential. 195 pp. Englisch.
3
9783839609163 - Geisler: / | Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts. | Fraunhofer
Geisler

/ | Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts. | Fraunhofer

Lieferung erfolgt aus/von: Deutschland ~EN NW

ISBN: 9783839609163 bzw. 383960916X, vermutlich in Englisch, Fraunhofer IRB, neu.

The combination of localized laser patterning and metal plating allows to replace conventional silver screen printing with nickel-copper plating to form inexpensive front contacts for crystalline silicon solar cells. In this work, a focus is put on effects that could cause inhomogeneous metal deposition and low metal contact adhesion. A descriptive model of the silicon nitride ablation mechanism is derived from SEM imaging and a precise recombination analysis using QSSPC measurements. Surface sensitive XPS measurements are conducted to prove the existence of a parasitic surface layer, identified as SiOxNy. The dense SiOxNy layer is an effective diffusion barrier, hindering the formation of a nickel silicide interlayer. After removal of the SiOxNy layer, cells show severe degradation caused by metal-induced shunting. These shunts are imaged using reverse biased electroluminescence imaging. A shunting mechanism is proposed and experimentally verified. New laser process sequences are devised and proven to produce cells with adhering Ni-Cu contacts. Conclusively the developed processes are assessed based on their industrial feasibility as well as on their efficiency potential.
4
9783839609163 - Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.

Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.

Lieferung erfolgt aus/von: Österreich ~EN NW AB

ISBN: 9783839609163 bzw. 383960916X, vermutlich in Englisch, neu, Hörbuch.

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Lieferung aus: Österreich, Lieferzeit: 5 Tage, zzgl. Versandkosten.
The combination of localized laser patterning and metal plating allows to replace conventional silver screen printing with nickel-copper plating to form inexpensive front contacts for crystalline silicon solar cells. In this work, a focus is put on effects that could cause inhomogeneous metal deposition and low metal contact adhesion. A descriptive model of the silicon nitride ablation mechanism is derived from SEM imaging and a precise recombination analysis using QSSPC measurements. Surface sensitive XPS measurements are conducted to prove the existence of a parasitic surface layer, identified as SiOxNy. The dense SiOxNy layer is an effective diffusion barrier, hindering the formation of a nickel silicide interlayer. After removal of the SiOxNy layer, cells show severe degradation caused by metal-induced shunting. These shunts are imaged using reverse biased electroluminescence imaging. A shunting mechanism is proposed and experimentally verified. New laser process sequences are devised and proven to produce cells with adhering Ni-Cu contacts. Conclusively the developed processes are assessed based on their industrial feasibility as well as on their efficiency potential.
5
9783839609163 - Christian Geisler: Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.
Christian Geisler

Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783839609163 bzw. 383960916X, vermutlich in Englisch, Fraunhofer Verlag, Taschenbuch, neu.

Lieferung aus: Deutschland, Versandkostenfrei.
Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.: The combination of localized laser patterning and metal plating allows to replace conventional silver screen printing with nickel-copper plating to form inexpensive front contacts for crystalline silicon solar cells. In this work, a focus is put on effects that could cause inhomogeneous metal deposition and low metal contact adhesion. A descriptive model of the silicon nitride ablation mechanism is derived from SEM imaging and a precise recombination analysis using QSSPC measurements. Surface sensitive XPS measurements are conducted to prove the existence of a parasitic surface layer, identified as SiOxNy. The dense SiOxNy layer is an effective diffusion barrier, hindering the formation of a nickel silicide interlayer. After removal of the SiOxNy layer, cells show severe degradation caused by metal-induced shunting. These shunts are imaged using reverse biased electroluminescence imaging. A shunting mechanism is proposed and experimentally verified. New laser process sequences are devised and proven to produce cells with adhering Ni-Cu contacts. Conclusively the developed processes are assessed based on their industrial feasibility as well as on their efficiency potential. Englisch, Taschenbuch.
6
383960916X - Christian Geisler: Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.
Christian Geisler

Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 383960916X bzw. 9783839609163, vermutlich in Englisch, Fraunhofer Verlag, Taschenbuch, neu.

83,00 + Versand: 7,50 = 90,50
unverbindlich
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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383960916X - Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.

Characterization of Laser Doped Silicon and Overcoming Adhesion Challenges of Solar Cells with Nickel-Copper Plated Contacts.

Lieferung erfolgt aus/von: Deutschland ~EN NW

ISBN: 383960916X bzw. 9783839609163, vermutlich in Englisch, neu.

Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
8
9783839609163 - Geisler, C: Characterization of Laser Doped Silicon
Geisler, C

Characterization of Laser Doped Silicon (2015)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783839609163 bzw. 383960916X, vermutlich in Englisch, Taschenbuch, neu.

Lieferung aus: Deutschland, Next Day, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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