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Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and
Refine Crystal Structures from Powder Diffraction Data (Paperback)
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Preise201320142015
Schnitt 173,98 200,06 193,10
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1
Georg Will (?):

Powder Diffraction The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data (?)

ISBN: 9783642066269 (?) bzw. 3642066267, in Deutsch, Springer, Taschenbuch, neu

275,43 + Versand: 3,55 = 278,98(unverbindlich)
Von Händler/Antiquariat, BuySomeBooks [52360437], Las Vegas, NV, U.S.A.
Paperback. 224 pages. Dimensions: 9.0in. x 6.0in. x 1.2in.Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN.
2
Will, Georg (?):

Powder Diffraction (?)

ISBN: 9783642066269 (?) bzw. 3642066267, in Deutsch, Springer, Berlin, Taschenbuch, neu

Versandkostenfrei
buecher.de GmbH & Co. KG, [1]
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.2010. ix, 224 S. 94 SW-Abb. 235 mmVersandfertig in 3-5 Tagen, Softcover
3
Georg Will (?):

Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data (2010) (?)

ISBN: 9783642066269 (?) bzw. 3642066267, in Deutsch, Springer Berlin Heidelberg, Taschenbuch, neu

323,93 + Versand: 7,69 = 331,62(unverbindlich)
Von Händler/Antiquariat, Revaluation Books [2134736], Exeter, DEV, United Kingdom
reprint edition. 234 pages. 9.00x6.00x1.20 inches. In Stock.
4
Georg Will (?):

Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data (?)

ISBN: 9783642066269 (?) bzw. 3642066267, in Deutsch, Springer, Taschenbuch, neu

178,54 + Versand: 3,15 = 181,69(unverbindlich)
Von Händler/Antiquariat, ExtremelyReliable [8304062], Richmond, TX, U.S.A.
This item is printed on demand.
5
Georg Will (?):

Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data (2010) (?)

ISBN: 9783642066269 (?) bzw. 3642066267, in Deutsch, Springer, Taschenbuch, neu

226,91 + Versand: 3,56 = 230,47(unverbindlich)
Von Händler/Antiquariat, ExtremelyReliable [8304062], RICHMOND, TX, U.S.A.
This item is printed on demand.