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100%: Paul F. Fewster: X-Ray Scattering from Semiconductors (2nd Edition) (ISBN: 9781860943607) 2003, in Englisch, Broschiert.Nur diese Ausgabe anzeigen…
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X-Ray Scattering from Semiconductors (2nd Edition) - 4 Angebote vergleichen
Bester Preis: € 89,28 (vom 14.01.2017)1
X-Ray Scattering from Semiconductors (2nd Edition) (2003)
EN HC NWISBN: 9781860943607 bzw. 1860943608, in Englisch, Imperial College Pr, gebundenes Buch, neu.
Lieferung aus: Schweiz, wird besorgt, Lieferzeit unbekannt.
semiconductors, This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented. gebundene Ausgabe, 01.07.2003.
semiconductors, This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented. gebundene Ausgabe, 01.07.2003.
2
X-Ray Scattering from Semiconductors (2nd Edition)
EN NWISBN: 9781860943607 bzw. 1860943608, in Englisch, Imperial College Press, Vereinigtes Königreich Großbritannien und Nordirland, neu.
Lieferung aus: Deutschland, zzgl. Versandkosten, Versandfertig innerhalb von 3 Wochen.
semiconductors, This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
semiconductors, This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
3
X-Ray Scattering From Semiconductors
EN NW EBISBN: 9781860943607 bzw. 1860943608, in Englisch, World Scientific Publishing Company, neu, E-Book.
Lieferung aus: Vereinigte Staaten von Amerika, E-Book zum download.
Technology, X-Ray Scattering From Semiconductors (2nd Edition), This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. eBook.
Technology, X-Ray Scattering From Semiconductors (2nd Edition), This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. eBook.
4
X-Ray Scattering from Semiconductors (2nd Edition)
EN HC NWISBN: 9781860943607 bzw. 1860943608, in Englisch, Imperial College Press, gebundenes Buch, neu.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd.
X-Ray-Scattering-from-Semiconductors~~Paul-F-Fewster, X-Ray Scattering from Semiconductors (2nd Edition), Hardcover.
X-Ray-Scattering-from-Semiconductors~~Paul-F-Fewster, X-Ray Scattering from Semiconductors (2nd Edition), Hardcover.
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