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73%: Vickerman, John C (Editor), and Gilmore, Ian S (Editor): Surface Analysis: The Principal Techniques (2nd Revised edition) (ISBN: 9780470017630) 2. Ausgabe, in Englisch, Broschiert.Nur diese Ausgabe anzeigen…
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Bester Preis: € 54,99 (vom 10.03.2017)1
Surface Analysis - The Principal Techniques
EN NWISBN: 9780470721575 bzw. 047072157X, Band: 313, in Englisch, John Wiley & Sons, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
Surface Analysis: InhaltsangabeList of Contributors.Preface.1 Introduction (John C. Vickerman).1.1 How do we Define the Surface 1.2 How Many Atoms in a Surface 1.3 Information Required.1.4 Surface Sensitivity.1.5 Radiation Effects – Surface Damage.1.6 Complexity of the Data.2 Auger Electron Spectroscopy (Hans Jö rg Mathieu).2.1 Introduction.2.2 Principle of the Auger Process.2.3 Instrumentation.2.4 Quantitative Analysis.2.5 Depth Profile Analysis.2.6 Summary.References.Problems.3 Electron Spectroscopy for Chemical Analysis (Buddy D. Ratner and David G. Castner).3.1 Overview.3.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids.3.3 Binding Energy and the Chemical Shift.3.4 Inelastic Mean Free Path and Sampling Depth.3.5 Quantification.3.6 Spectral Features.3.7 Instrumentation.3.8 Spectral Quality.3.9 Depth Profiling.3.10 X– Y Mapping and Imaging.3.11 Chemical Derivatization.3.12 Valence Band.3.13 Perspectives.3.14 Conclusions.Acknowledgements.References.Problems.4 Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman).4.1 Introduction.4.2 Basic Concepts.4.3 Experimental Requirements.4.4 Secondary Ion Formation.4.5 Modes of Analysis.4.6 Ionization of the Sputtered Neutrals.4.7 Ambient Methods of Desorption Mass Spectrometry.References.Problems.5 Dynamic SIMS (David McPhail and Mark Dowsett).5.1 Fundamentals and Attributes.5.2 Areas and Methods of Application.5.3 Quantification of Data.5.4 Novel Approaches.5.5 Instrumentation.5.6 Conclusions.References.Problems.6 Low-Energy Ion Scattering and Rutherford Backscattering (Edmund Taglauer).6.1 Introduction.6.2 Physical Basis.6.3 Rutherford Backscattering.6.4 Low-Energy Ion Scattering.Acknowledgement.References.Problems.Key Facts.7 Vibrational Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner).7.1 Introduction.7.2 Infrared Spectroscopy from Surfaces.7.3 Electron Energy Loss Spectroscopy (EELS).7.4 The Group Theory of Surface Vibrations.7.5 Laser Raman Spectroscopy from Surfaces.7.6 Inelastic Neutron Scattering (INS).7.7 Sum-Frequency Generation Methods.References.Problems.8 Surface Structure Determination by Interference Techniques (Christopher A. Lucas).8.1 Introduction.8.2 Electron Diffraction Techniques.8.3 X-ray Techniques.8.4 Photoelectron Diffraction.References.9 Scanning Probe Microscopy (Graham J. Leggett).9.1 Introduction.9.2 Scanning Tunnelling Microscopy.9.3 Atomic Force Microscopy.9.4 Scanning Near-Field Optical Microscopy.9.5 Other Scanning Probe Microscopy Techniques.9.6 Lithography Using Probe Microscopy Methods.9.7 Conclusions.References.Problems.10 The Application of Multivariate Data Analysis Techniques inSurface Analysis (Joanna L.S. Lee and Ian S. Gilmore).10.1 Introduction.10.2 Basic Concepts.10.3 Factor Analysis for Iden, Englisch, Ebook.
Surface Analysis: InhaltsangabeList of Contributors.Preface.1 Introduction (John C. Vickerman).1.1 How do we Define the Surface 1.2 How Many Atoms in a Surface 1.3 Information Required.1.4 Surface Sensitivity.1.5 Radiation Effects – Surface Damage.1.6 Complexity of the Data.2 Auger Electron Spectroscopy (Hans Jö rg Mathieu).2.1 Introduction.2.2 Principle of the Auger Process.2.3 Instrumentation.2.4 Quantitative Analysis.2.5 Depth Profile Analysis.2.6 Summary.References.Problems.3 Electron Spectroscopy for Chemical Analysis (Buddy D. Ratner and David G. Castner).3.1 Overview.3.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids.3.3 Binding Energy and the Chemical Shift.3.4 Inelastic Mean Free Path and Sampling Depth.3.5 Quantification.3.6 Spectral Features.3.7 Instrumentation.3.8 Spectral Quality.3.9 Depth Profiling.3.10 X– Y Mapping and Imaging.3.11 Chemical Derivatization.3.12 Valence Band.3.13 Perspectives.3.14 Conclusions.Acknowledgements.References.Problems.4 Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman).4.1 Introduction.4.2 Basic Concepts.4.3 Experimental Requirements.4.4 Secondary Ion Formation.4.5 Modes of Analysis.4.6 Ionization of the Sputtered Neutrals.4.7 Ambient Methods of Desorption Mass Spectrometry.References.Problems.5 Dynamic SIMS (David McPhail and Mark Dowsett).5.1 Fundamentals and Attributes.5.2 Areas and Methods of Application.5.3 Quantification of Data.5.4 Novel Approaches.5.5 Instrumentation.5.6 Conclusions.References.Problems.6 Low-Energy Ion Scattering and Rutherford Backscattering (Edmund Taglauer).6.1 Introduction.6.2 Physical Basis.6.3 Rutherford Backscattering.6.4 Low-Energy Ion Scattering.Acknowledgement.References.Problems.Key Facts.7 Vibrational Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner).7.1 Introduction.7.2 Infrared Spectroscopy from Surfaces.7.3 Electron Energy Loss Spectroscopy (EELS).7.4 The Group Theory of Surface Vibrations.7.5 Laser Raman Spectroscopy from Surfaces.7.6 Inelastic Neutron Scattering (INS).7.7 Sum-Frequency Generation Methods.References.Problems.8 Surface Structure Determination by Interference Techniques (Christopher A. Lucas).8.1 Introduction.8.2 Electron Diffraction Techniques.8.3 X-ray Techniques.8.4 Photoelectron Diffraction.References.9 Scanning Probe Microscopy (Graham J. Leggett).9.1 Introduction.9.2 Scanning Tunnelling Microscopy.9.3 Atomic Force Microscopy.9.4 Scanning Near-Field Optical Microscopy.9.5 Other Scanning Probe Microscopy Techniques.9.6 Lithography Using Probe Microscopy Methods.9.7 Conclusions.References.Problems.10 The Application of Multivariate Data Analysis Techniques inSurface Analysis (Joanna L.S. Lee and Ian S. Gilmore).10.1 Introduction.10.2 Basic Concepts.10.3 Factor Analysis for Iden, Englisch, Ebook.
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Surface Analysis - The Principal Techniques
EN NWISBN: 9780470721575 bzw. 047072157X, in Englisch, John Wiley & Sons, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
Surface Analysis: This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Englisch, Ebook.
Surface Analysis: This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Englisch, Ebook.
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